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復消色差光學設計
可選長工作距離
微分辨力
High Numerical Aperture (NA) up to 1.45
Chromatic Aberration Correction from 400 - 1000nm
Uniform Image Flatness over Large FOVs
這些物鏡采用高標準、質量好的無應力光學系統，提供了一個較長的工作距離和大的數值孔徑。分辨力可從5微米到0.34微米,目前這種鏡頭正在被大規(guī)模的使用。所有形式的放大倍率都集成在一個焦距為200mm的管上，接口螺紋為M26 x 36 TPI，可以選配所有的Mitutoyo品牌的配件。
型號: | UPLXAPO4X | UPLXAPO10X | UPLXAPO20X | UPLXAPO40X | UPLXAPO60XO | UPLXAPO100XO |
放大率: | 4X | 10X | 20X | 40X | 60X | 100X |
數字孔徑NA: | 0.16 | 0.4 | 0.8 | 0.95 | 1.42 | 1.45 |
工作距離(mm): | 13 | 3.1 | 0.61 | 0.18 | 0.15 | 0.135 |
蓋玻片厚度(mm): | 0 | 0.17 | 0.17 | 0.11 - 0.23 | 0.17 | 0.17 |
Field Number (mm): | 26.5 | 26.5 | 26.5 | 26.5 | 26.5 | 26.5 |
焦距FL (mm): | 45 | 18 | 9 | 4.5 | 3 | 1.8 |
安裝螺紋: | RMS | RMS | RMS | RMS | RMS | RMS |
Parfocal Length (mm): | 45.06 | 45.06 | 45.06 | 45.06 | 45.06 | 45.06 |
Immersion Liquid: | N/A | N/A | N/A | N/A | Oil | Oil |
注意 : | 注意 : | 注意 : | 注意 : | |||
Spring-loaded | Spring-loaded and equipped with Correction Collar | Spring-loaded. Recommended Immersion Oil | Spring-loaded. Recommended Immersion Oil |
Olympus X-Line Extended Apochromat Objectives (also referred to as the UPLXAPO series) are Olympus’ next generation high performance objectives that simultaneously feature high numerical aperture (NA), broadband chromatic aberration correction, and excellent image flatness. The high numerical aperture (NA) allows for excellent light collection efficiency to better capture faint signals, enabling a shorter exposure time and higher contrast. The broad chromatic aberration correction compensates for the wavelength-dependent spatial shift of colors to achieve excellent color reproduction. These objectives also achieve high image flatness from the center to the edges of images over large fields of view (FOV), making them ideal for image stitching and quantitative image analysis. Olympus X-Line Extended Apochromat Objectives are used in demanding life science and clinical applications including pathology, fluorescence microscopy, multicolor or widefield fluorescence imaging, confocal or super resolution microscopy, and whole slide imaging.
